Abstract: X-ray diffraction (XRD) technique was used to characterize the titanium silicalite (TS-1) zeolites with various amounts of titanium and the optimal test conditions were obtained by adjusting the instrument parameters. The calculation method for lattice parameters was established by the Rietveld full spectrum fitting technology for the XRD patterns. The calculation results suggest that when the mole fraction of the titanium in the raw material is less than 2.5 %, the lattice parameter of the TS-1 zeolite increases linearly with the titanium content, indicating part of the titanium in the raw materials entering into the framework of the TS-1 zeolite. The lattice parameter is basically unchanged above 2.5 % mole fraction. It can be inferred that the excessive titanium atoms（a part of the 2.5% above）do not enter into the framework of the TS-1 zeolite.